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J. Phys.: Condens. Matter, 18, S949-S962 , (2006) [doi: 10.1088/0953-8984/18/25/S03]

X-ray diffraction evaluation of stress in high pressure deformation experiments

S. Merkel

This paper explores the applicability of x-ray diffraction measurements of stress to high pressure deformation experiments. We model measurements of elastic lattice strains in various geometries for both axial and rotational deformation apparatus. We then show that, for most cases, stresses can be inverted from the diffraction data. A comparison between the results of our models and actual experimental data also indicates that plastic deformation can have an influence that is not addressed properly in the elastic models of lattice strains and should therefore be treated with caution.

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© Sébastien Merkel, Université de Lille, France

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