Advanced structural characterization

This class is tought at master's level in physics. The idea is to train students at materials characterization techniques. I teach a general introduction and a more specific section on diffraction and large scale facilities. Other membres of the department teach on electron microscopy and spectroscopy.

• Introduction

  General description of characterization techniques, imaging, spectroscopy, diffraction, etc., and experimental tools, diffractometers, large instruments, microscopes, etc..
  PDF Document
  PDF Document, 6 slides per page, for printing

• Radiation-matter interactions

  Physical phenomena used in characterization: photon-matter interactions, electron-matter interactions, neutron-matter interactions.
  PDF Document
  PDF Document, 6 slides per page, for printing

• Diffraction

  Diffraction - Diffraction peaks - Experimental methods - Intensity of diffraction peaks - The Rietveld method - Shape of a diffraction peak - Rietveld refinement parameters.
  PDF Document
  PDF Document, 6 slides per page, for printing

• X-ray sources

  The generation of X-rays, in an X-ray tube or with a synchrotron.
  PDF Document
  PDF Document, 6 slides per page, for printing