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Journal of Applied Crystallography, 48, 1307-1313, (2015) [doi: 10.1107/S1600576715010390]

Multifit/Polydefix: a Framework for the Analysis of Polycrystal Deformation using X-Rays

S. Merkel and N. Hilairet

Multifit/Polydefix is an open-source IDL software package for an efficient processing of diffraction data obtained in deformation apparatuses at synchrotron beamlines. Multifit allows users to decompose two-dimensional diffraction images into azimuthal slices, fit peak positions, shape, and intensities, and propagate the results to other azimuths and images. Polydefix is for analysis of deformation experiments. Starting from output files created in Multifit or other packages, it will extract elastic lattice strains, evaluate sample pressure and differential stress, and prepare input files for further texture analysis. The Multifit/Polydefix package is designed to make the tedious data analysis of synchrotron-based plasticity, rheology, or other time-dependent experiments very straightforward and accessible to a wider community.

Full text of this article is available online.


© Sébastien Merkel, Université de Lille, France

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