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J. Phys.: Condens. Matter , 18, S995-S1005, (2006) [doi: 10.1088/0953-8984/18/25/S07]

Quantitative Rietveld texture analysis of CaSiO3 perovskite deformed in a diamond anvil cell

L. Miyagi, S. Merkel, T. Yagi, N. Sata, Y. Ohishi and H.-R. Wenk

The Rietveld method is used to extract quantitative texture information from a single synchrotron diffraction image of a CaSiO3 perovskite sample deformed in axial compression in a diamond anvil cell. The image used for analysis was taken in radial geometry at 49 GPa and room temperature. We obtain a preferred orientation of {100} lattice planes oriented perpendicular to the compression direction and this is compatible with {110}110 slip.

Full text of this article is available online.


© Sébastien Merkel, Université de Lille, France

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