Material Analysis Using Diffraction
Maud is a general diffraction/reflectivity analysis program mainly based on the Rietveld method. Maud is being developped by L. Lutteroti at the University of Trento.
It can be used to process radial diffraction data, extract stress, and lattice preferred orientations, from within one program. Since it is based on the Rietveld technique, it is very powerful and can be used to extract tons of information, and in a self-consistent way, from diffraction images.
On the other hand, it can be dangerous as you do not always know or understand what the software is doing.
You can find more information on MAUD at the MAUD homepage.